Topics

  • Atom Probe Techniques
  • In situ and in operando microscopy techniques
  • Lattice defects in bulk materials
  • Quantum wells and strained layer epitaxy
  • Quantum wires and quantum dots
  • Scanning electron and ion beam techniques
  • Scanning probe microscopy
  • Analytical electron microscopy and electron holography
  • Other

Key dates

Abstract submission deadline: extended

19 January 2019

Early registration deadline:

22 February 2019

Registration deadline:

29 March 2019