Topics

  • Atom Probe Techniques
  • In situ and in operando microscopy techniques
  • Lattice defects in bulk materials
  • Quantum wells and strained layer epitaxy
  • Quantum wires and quantum dots
  • Scanning electron and ion beam techniques

Key dates

Abstract submission deadline:

19 December 2018

Early registration deadline:

22 February 2019

Registration deadline:

29 March 2019