Exhibitors

 

Attolight

@attolight

Attolight designs and builds fully integrated SEM and STEM based cathodoluminescence solutions with ultrahigh spatial and pico-second time resolution. The company invented quantitative continuous and time-resolved cathodoluminescence, a non-destructive characterization method capable of acquiring spectroscopic data at the nanoscale and providing deeper insights into the structure of materials with a variety of applications in material research and development.

     
 

Bruker UK Ltd

Bruker presents a unique range of analytical tools for materials characterization in electron microscopes.

The electron microscope analyzers EDS for SEM and TEM, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis. The full integration of all these techniques into the ESPRIT 2 software suite allows researchers to easily combine data obtained by these complementary methods.

     
 

CN Technical Services Ltd

@CNTech1

CN Tech specialises in all areas of materials testing for research and industry. We provide sales and service across a diverse product range, including instrumentation for surface analysis, materials testing, electron microscopy and atomic force microscopy. We also provide environmental isolation solutions, and a range of laboratory supplies.

     
     

Key dates

Abstract submission deadline:

19 December 2018

Early registration deadline:

22 February 2019

Registration deadline:

29 March 2019