Attolight designs and builds fully integrated SEM and STEM based cathodoluminescence solutions with ultrahigh spatial and pico-second time resolution. The company invented quantitative continuous and time-resolved cathodoluminescence, a non-destructive characterization method capable of acquiring spectroscopic data at the nanoscale and providing deeper insights into the structure of materials with a variety of applications in material research and development.
Bruker presents a unique range of analytical tools for materials characterization in electron microscopes.
The electron microscope analyzers EDS for SEM and TEM, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis. The full integration of all these techniques into the ESPRIT 2 software suite allows researchers to easily combine data obtained by these complementary methods.
CN Tech specialises in all areas of materials testing for research and industry. We provide sales and service across a diverse product range, including instrumentation for surface analysis, materials testing, electron microscopy and atomic force microscopy. We also provide environmental isolation solutions, and a range of laboratory supplies.
As a global leader in imaging solutions for semiconductor technologies, Hitachi High-Technologies are committed to providing the most outstanding equipment for use in industrial development and academic science. Hitachi High-Technologies experience and comprehensive know-how secures our reputation as an innovation leader in the field of semiconductor materials microscopy.
Mi-Net Technology is a scientific distributor of advanced materials, components and instruments for research and industry. Formed in 1986 Mi-Net has enjoyed over 30 successful years and currently represents a multitude of leading edge suppliers. Mi-Net represents CS Instruments an instrument manufacturer specialized in Atomic Force Microscopy with innovative electrical and magnetic characterisation modes such as the award winning ResiScope (resistance mapping), HD-KFM, Scanning Microwave Impedance Microscopy (sMIM) and Magnetic Lateral Field Microscopy.
We empower scientists, engineers, and researchers to discover and analyze new phenomenon by visualizing biological, chemical and physical processes in completely new ways. Our field-proven products offer an unparalleled view into sample behavior by combining in situ experiment control with the analysis and resolution capabilities of the modern electron microscope. Through continual innovation, we create solutions that improve productivity and generate actionable data to accelerate discovery.