Attolight designs and builds fully integrated SEM and STEM based cathodoluminescence solutions with ultrahigh spatial and pico-second time resolution. The company invented quantitative continuous and time-resolved cathodoluminescence, a non-destructive characterization method capable of acquiring spectroscopic data at the nanoscale and providing deeper insights into the structure of materials with a variety of applications in material research and development.


Bruker UK Ltd

Bruker presents a unique range of analytical tools for materials characterization in electron microscopes.

The electron microscope analyzers EDS for SEM and TEM, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis. The full integration of all these techniques into the ESPRIT 2 software suite allows researchers to easily combine data obtained by these complementary methods.


CN Technical Services Ltd


CN Tech specialises in all areas of materials testing for research and industry. We provide sales and service across a diverse product range, including instrumentation for surface analysis, materials testing, electron microscopy and atomic force microscopy. We also provide environmental isolation solutions, and a range of laboratory supplies.


Key dates

Abstract submission deadline:

19 December 2018

Early registration deadline:

22 February 2019

Registration deadline:

29 March 2019